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You searched for: mediatype:texts AND collection:NISTTechNotes AND subject:"Electric Resistance."
[texts]Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples (Volume NBS Technical Note 199) - Swartzendruber, Lydon J.
Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diam
Keywords: Semiconductors; Electric resistance
Downloads: 214
[texts]NIST measurement service for DC standard resistors (Volume NIST Technical Note 1298) - Dziuba, Ronald F.; Boynton, Paul A.; Elmquist, Randolph E.; Jarrett, Dean G.; Moore, Theodore P.; Neal, Jack D.

Keywords: Electric resistance--Measurement--Standards
Downloads: 64
[texts]Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples (Volume NBS Technical Note 241) - Swartzendruber, Lydon J.

Keywords: Electric resistance; Semiconductors; FORTRAN (Computer program language)
Downloads: 190
[texts]A four-terminal current shunt with calculable AC response (Volume NIST Technical Note 1462) - Laug, O. B.; Souders, T. M.; Waltrip, B. C.

Keywords: Inductance; Electric resistance; Electric currents, Alternating
Downloads: 30
[texts]NIST Measurement Assurance Program for resistance (Volume NIST Technical Note 1424) - Boynton, P. A. (Paul Andrew), 1961-; Sims, June E.; Dziuba, Ronald F.

Keywords: Electric resistance--Measurement--Standards--United States
Downloads: 23
[texts]Survey of electrical resistivity measurements on 16 pure metals in the temperature range 0 to 273 K. (Volume NBS Technical Note 365) - Hall, L. A.

Keywords: Metals--Effect of low temperatures on; Electric resistance
Downloads: 98
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